Researchers from the Institute for Soil Sciences and the Agricultural Institute at the HUN-REN Centre for Agricultural Research used root electrical capacitance method for non-destructive phenotyping of winter wheat cultivars. Their results were published in the journal “Plants” in open access form.
They found significant linear relationships between the electrical capacitance measured at flowering and aboveground biomass, nutrient status (based on the measurement of flag-leaf area and chlorophyll content) and grain yield at a plant and plot scale. Therefore, root electrical capacitance can be considered a new predictor variable in allometric models for forecasting cereal growth, contributing to improved crop management and selection strategies.
Publication:
Cseresnyés I, Pokovai K, Bányai J, Mikó P (2022): Root electrical capacitance can be a promising plant phenotyping parameter in wheat. Plants 11(21): 2975. doi:10.3390/plants11212975
